In-Situ Observation of SiC Bulk Single Crystal Growth by XRD System
crystal growth rate、rocking curve、single crystal growth、growth condition、the optimum
24
O7(晶体学)
METI NSS Program Ultra-Low Loss Power Device Technology;The high-resolution X-ray topography was performed at BL20B2 in the SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute2005A0403-ND3c-np
2008-01-07(万方平台首次上网日期,不代表论文的发表时间)
共5页
49-53