Phase change effect of low melting point metal for an automatic cooling of USB flash memory

摘要：

1 IntroductionThe USB flash memory and solid-state disk are increasingly used in recent years and the data transfer speed has developed from USB 1.1,USB 2.0 to USB 3.0.This brings about the high power generation and thus evident temperature increase during the high-speed data transfer between computer and the USB flash memory.In general,a lower temperature would allow for a higher data transfer speed.For example,the gate leakage current in transistors increases exponentially with temperature.Its reliability and performance are also heavily gated by thermal factors ”1”.

机标关键词：flash memory、data transfer、gate leakage current、lower temperature、power generation、used in

所属期刊栏目：06

分类号：TE09(能源与节能)

在线出版日期：2012-11-29（万方平台首次上网日期，不代表论文的发表时间）

页码：207-209