Local electrical characterization of two-dimensional materials with functional atomic force microscopy
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the National Natural Science Foundation of China NSFC.21622304,61674045,and 11604063;the Ministry of Science and Technology MOST of China2016YFA0200700;the Strategic Priority Research Program,the Key Research Program of Frontier Sciences and Instrument Developing Project of Chinese Academy of Sciences CAS.XDB30000000,QYZDB-SSW-SYS031,and YZ201418;Osaka University”s International Joint Research Promotion Program Nos.J171013014 and J171013007.Z.H.Cheng was supported by Distinguished Technical Talents Project and Youth Innovation Promotion Association CAS,the Fundamental Research Funds for the Central Universities and the Research Funds of Re18XNLG01
2019-07-04(万方平台首次上网日期,不代表论文的发表时间)
共21页
85-105