Post-deposition-annealed lanthanum-doped cerium oxide thin films:structural and electrical properties
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This work was financially supported by Council of Scientific and Industrial ResearchCSIR,New DelhiNo.220716/16/EMR-Ⅱand Special Assistance Programme on Departmental Research SupportSAP-DRSfrom University Grant CommissionUGC,New DelhiNo.503/4/DRS-Ⅲ/2016-SAP-Ⅰ;Authors are grateful to Prof;Shirsath for providing AFM facility under RUSA scheme and to Microelectronics Department,North China University of Technology,Beijing,China,for providing necessary electrical characterization facilities
2021-09-17(万方平台首次上网日期,不代表论文的发表时间)
共9页
1835-1843