E-beam manipulation of Si atoms on graphene edges with an aberration-corrected scanning transmission electron microscope
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We would like to thank Dr.Ivan Vlassiouk for provision of the graphene samples and Dr.Francois Amet for assisting with the argon-oxygen cleaning procedure.Research is supported by Oak Ridge National Laboratory”s Center for Nanophase Materials Sciences;which is sponsored by the Scientific User Facilities Division,Office of Basic Energy Sciences,U.S.Department of Energy;by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory,managed by UT-Battelle,LLC,for the U.S.Department of Energy
2019-01-09（万方平台首次上网日期，不代表论文的发表时间）
共10页
6217-6226
