Chemical Mechanical Polishing of Glass Substrate with α-Alumina-g-Polystyrene Sulfonic Acid Composite Abrasive
Glass Substrate、Mechanical Polishing、chemical mechanical polishing、composite particles、surface defects、glass substrate、Al2O3、scanning electron microscopy、Atomic force microscopy、infrared spectroscopy、dispersion stability、influencing factors、mass spectroscopy、Fourier transform、during、CMP slurries、structure、research、In order、acid
23
TB3;TG1
National Natural Science Foundation of ChinaGrant 60773080, Grant 90923016;Innovation Program of Shanghai Municipal Education Commission, ChinaGrant 09ZZ86;Leading Academic Discipline Project of Shanghai Municipal Education Commission,ChinaGrant J50102
2010-09-13(万方平台首次上网日期,不代表论文的发表时间)
共6页
276-281