QUALITY CONTROL OF SEMICONDUCTOR PACKAGING BASED ON PRINCIPAL COMPONENTS ANALYSIS
principal components analysis、control chart、quality characteristics、surface mounting、used in
20
TH11
国家自然科学基金70372062;Hi-Tech Program of Tianjin city, China04310881R
2008-04-14(万方平台首次上网日期,不代表论文的发表时间)
共3页
84-86